Invention Grant
- Patent Title: Profiling solid state samples
- Patent Title (中): 分析固态样品
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Application No.: US11503680Application Date: 2006-08-14
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Publication No.: US07791071B2Publication Date: 2010-09-07
- Inventor: Neal R. Rueger , Mark J. Williamson , Gurtej S. Sandhu , Justin R. Arrington
- Applicant: Neal R. Rueger , Mark J. Williamson , Gurtej S. Sandhu , Justin R. Arrington
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman, Lundberg & Woessner, P.A.
- Main IPC: H01L23/58
- IPC: H01L23/58

Abstract:
Methods and apparatus may operate to position a sample, including an imager lens surface, within a processing chamber. Further activities may include creating a layer of reactive material in proximity with the imager lens surface, and exciting a portion of the layer of reactive material in proximity with the imager lens surface to form chemical radicals. Additional activities may include removing a portion of the material in proximity to the excited portion of the imager lens surface to a predetermined level, and continuing the creating, exciting and removing actions until at least one of a plurality of stop criteria occurs.
Public/Granted literature
- US20080038863A1 Profiling solid state samples Public/Granted day:2008-02-14
Information query
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