发明授权
- 专利标题: System and method for testing the accuracy of real time clocks
- 专利标题(中): 用于测试实时时钟精度的系统和方法
-
申请号: US12107784申请日: 2008-04-23
-
公开(公告)号: US07711517B2公开(公告)日: 2010-05-04
- 发明人: Ming-Shiu Ou Yang , Wei-Yuan Chen
- 申请人: Ming-Shiu Ou Yang , Wei-Yuan Chen
- 申请人地址: TW Tu-Cheng, Taipei Hsien
- 专利权人: Hon Hai Precision Industry Co., Ltd.
- 当前专利权人: Hon Hai Precision Industry Co., Ltd.
- 当前专利权人地址: TW Tu-Cheng, Taipei Hsien
- 代理商 Frank R. Niranjan
- 优先权: CN200710201397 20070820
- 主分类号: G04F1/00
- IPC分类号: G04F1/00
摘要:
A method for testing the accuracy of real time clocks is disclosed. The method includes the steps of: setting test parameters for testing the accuracy of real time clocks (RTCs), the test parameters comprising a test time length, a test time sampling interval, and an acceptable margin; synchronizing the time of an RTC IC and an RTC to be tested via a UUT; reading a current time of the RTC IC and the RTC via the UUT at each test time sampling interval; calculating a time difference between the current time of the RTC IC and the RTC via the UUT, and measuring whether the absolute value of the time difference is less than the acceptable margin; detecting whether the test time length is over; repeating the test process if the test time length is not over, or outputting test pass information if the test time length is over. A related system is also disclosed.
公开/授权文献
信息查询