发明授权
- 专利标题: Sample analyzer and error information displaying method
- 专利标题(中): 样品分析仪和错误信息显示方法
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申请号: US12284146申请日: 2008-09-18
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公开(公告)号: US07707010B2公开(公告)日: 2010-04-27
- 发明人: Yuji Wakamiya , Tomohiro Okuzaki , Hisato Takehara
- 申请人: Yuji Wakamiya , Tomohiro Okuzaki , Hisato Takehara
- 申请人地址: JP Kobe
- 专利权人: Sysmex Corporation
- 当前专利权人: Sysmex Corporation
- 当前专利权人地址: JP Kobe
- 代理机构: Brinks Hofer Gilson & Lione
- 优先权: JP2007-243428 20070920
- 主分类号: G06F17/40
- IPC分类号: G06F17/40
摘要:
The invention provides a sample analyzer by which a position of any error status in the sample analyzer can be easily found by a user to allow the user to carry out an error recovery operation in an accurate and prompt manner. The sample analyzer 1 comprises a sensor for detecting a status of a measurement unit 2 including an error status; a display section 400b; and a controller 400a for controlling the display section 400b so as to display recovery information for recovering the measurement unit 2 from the error status and an error-occurring place image regarding a place where an error has occurred, when the sensor detects the error status of the measurement unit 2.
公开/授权文献
- US20090082984A1 Sample analyzer and error information displaying method 公开/授权日:2009-03-26
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