发明授权
- 专利标题: Calibration circuit of on-die termination device
- 专利标题(中): 管芯端接装置的校准电路
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申请号: US12099350申请日: 2008-04-08
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公开(公告)号: US07683657B2公开(公告)日: 2010-03-23
- 发明人: Ki-Ho Kim
- 申请人: Ki-Ho Kim
- 申请人地址: KR Gyeonggi-do
- 专利权人: Hybix Semiconductor, Inc.
- 当前专利权人: Hybix Semiconductor, Inc.
- 当前专利权人地址: KR Gyeonggi-do
- 代理机构: IP & T Law Firm PLC
- 优先权: KR10-2007-0128238 20071211
- 主分类号: H03K17/16
- IPC分类号: H03K17/16 ; H03K19/003
摘要:
A calibration circuit of an on-die termination device includes a code generating unit configured to receive a voltage of a calibration node and a reference voltage, to generate calibration codes. The calibration unit also includes a calibration resistor unit having parallel resistors which are turned on/off in response to each of the calibration codes and connected to the calibration node, a turn-on strength of at least one of the parallel resistors being controlled by a control signal.
公开/授权文献
- US20090146683A1 CALIBRATION CIRCUIT OF ON-DIE TERMINATION DEVICE 公开/授权日:2009-06-11
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