发明授权
- 专利标题: Membrane IC fabrication
- 专利标题(中): 膜IC制造
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申请号: US10700429申请日: 2003-11-03
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公开(公告)号: US07670893B2公开(公告)日: 2010-03-02
- 发明人: Glenn J Leedy
- 申请人: Glenn J Leedy
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Thomas, Kayden, Horstemeyer & Risley
- 主分类号: H01L21/8238
- IPC分类号: H01L21/8238 ; H01L23/58
摘要:
General purpose methods for the fabrication of integrated circuits from flexible membranes formed of very thin low stress dielectric materials, such as silicon dioxide or silicon nitride, and semiconductor layers. Semiconductor devices are formed in a semiconductor layer of the membrane. The semiconductor membrane layer is initially formed from a substrate of standard thickness, and all but a thin surface layer of the substrate is then etched or polished away. In another version, the flexible membrane is used as support and electrical interconnect for conventional integrated circuit die bonded thereto, with the interconnect formed in multiple layers in the membrane. Multiple die can be connected to one such membrane, which is then packaged as a multi-chip module. Other applications are based on (circuit) membrane processing for bipolar and MOSFET transistor fabrication, low impedance conductor interconnecting fabrication, flat panel displays, maskless (direct write) lithography, and 3D IC fabrication.
公开/授权文献
- US20040197951A1 Membrane IC fabrication 公开/授权日:2004-10-07
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