发明授权
- 专利标题: Radiographic inspection system and method
- 专利标题(中): 射线检查系统及方法
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申请号: US11864315申请日: 2007-09-28
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公开(公告)号: US07653175B2公开(公告)日: 2010-01-26
- 发明人: Clarence L. Gordon, III , Manoharan Venugopal , Debasish Mishra , Raghu Chatanathodi , Richard Henry Bossi , Michael Craig Hutchinson
- 申请人: Clarence L. Gordon, III , Manoharan Venugopal , Debasish Mishra , Raghu Chatanathodi , Richard Henry Bossi , Michael Craig Hutchinson
- 申请人地址: US NY Niskayuna US IL Chicago
- 专利权人: General Electric Company,The Boeing Company
- 当前专利权人: General Electric Company,The Boeing Company
- 当前专利权人地址: US NY Niskayuna US IL Chicago
- 代理商 Penny A. Clarke
- 主分类号: G01N23/04
- IPC分类号: G01N23/04
摘要:
A system is provided for radiographic inspection of an object comprising multiple having different material properties. The system comprises a radiation source configured to generate radiation, a display unit for generating a graphical user interface (GUI) including multiple fields. A user enters input data via the fields in the GUI. The input data relates to one or more material properties for each of the regions. A processor is configured to compute a plurality of exposure parameters based on the input data.
公开/授权文献
- US20090086914A1 RADIOGRAPHIC INSPECTION SYSTEM AND METHOD 公开/授权日:2009-04-02
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