发明授权
- 专利标题: Radiation detecting apparatus and method for manufacturing the same
- 专利标题(中): 辐射检测装置及其制造方法
-
申请号: US12260035申请日: 2008-10-28
-
公开(公告)号: US07642519B2公开(公告)日: 2010-01-05
- 发明人: Kazumi Nagano
- 申请人: Kazumi Nagano
- 申请人地址: JP Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JP Tokyo
- 代理机构: Fitzpatrick, Cella, Harper & Scinto
- 优先权: JP2003-102895 20030407
- 主分类号: G01T1/20
- IPC分类号: G01T1/20
摘要:
An underlayer of a phosphor layer is disposed on a sensor panel including two-dimensionally arranged photoelectric conversion devices. The surface of the underlayer is subjected to atmospheric pressure plasma treatment. The phosphor layer is formed on the surface-treated underlayer. Then, the phosphor layer is covered with a moisture-resistant protective layer, a reflection layer, and another protective layer. Thus, the phosphor layer is prevented from peeling due to adhesion failure, and is constituted of uniformly shaped crystals by vapor deposition. A resulting radiation detecting apparatus exhibits high sensitivity and high definition, producing a uniform photoelectric conversion efficiency.
公开/授权文献
信息查询