发明授权
- 专利标题： Optical measurement apparatus
- 专利标题（中）： 光学测量装置
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申请号： US10594528申请日： 2005-03-29
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公开(公告)号： US07583382B2公开(公告)日： 2009-09-01
- 发明人: Takakazu Yano , Kenji Matsumoto , Tadahiro Fukuda , Miharu Sugiura
- 申请人： Takakazu Yano , Kenji Matsumoto , Tadahiro Fukuda , Miharu Sugiura
- 申请人地址： JP Tokyo
- 专利权人： Citizen Holdings Co., Ltd.
- 当前专利权人： Citizen Holdings Co., Ltd.
- 当前专利权人地址： JP Tokyo
- 代理机构： Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- 优先权： JP2004-094194 20040329; JP2004-276282 20040924; JP2004-278936 20040927
- 国际申请： PCT/JP2005/006564 WO 20050329
- 国际公布： WO2005/093410 WO 20051006
- 主分类号： G01N21/00
- IPC分类号： G01N21/00 ; G01N3/00 ; C02F1/461
摘要：
An object of the present invention is to provide an optical measurement apparatus equipped with an ion-exchange resin for pretreating a sample, thereby enabling the concentration of component in the sample to be measured with higher accuracy. The optical measurement apparatus of the present invention includes, in addition to the ion-exchange resin, an optical measurement section for measuring, based on the optical characteristics of the component, the concentration of the component in the sample after the sample is passed through the ion-exchange resin.
公开/授权文献
- US20070273868A1 Optical Measurement Apparatus 公开/授权日：2007-11-29
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