Invention Grant
- Patent Title: Placement configuration of MIM type capacitance element
- Patent Title (中): MIM型电容元件的放置配置
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Application No.: US11349082Application Date: 2006-02-08
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Publication No.: US07515394B2Publication Date: 2009-04-07
- Inventor: Yutaka Nabeshima
- Applicant: Yutaka Nabeshima
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP2005-037695 20050215
- Main IPC: H01G4/005
- IPC: H01G4/005 ; H01G4/228

Abstract:
A placement configuration of MIM type capacitance elements comprises a group of first capacitance elements in which the first capacitance elements as the MIM type capacitance elements are placed in tandem and a group of second capacitance elements in which the second capacitance elements as the MIM type capacitance elements are placed in tandem, wherein the group of first capacitance elements and the group of second capacitance elements are alternately placed in parallel with each other with an equal interval therebetween.
Public/Granted literature
- US20060181656A1 Placement configuration of MIM type capacitance element Public/Granted day:2006-08-17
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