Invention Grant
US07422635B2 Methods and apparatus for processing microfeature workpieces, e.g., for depositing materials on microfeature workpieces
失效
用于加工微型工件的方法和装置,例如用于在微型工件上沉积材料
- Patent Title: Methods and apparatus for processing microfeature workpieces, e.g., for depositing materials on microfeature workpieces
- Patent Title (中): 用于加工微型工件的方法和装置,例如用于在微型工件上沉积材料
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Application No.: US10652461Application Date: 2003-08-28
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Publication No.: US07422635B2Publication Date: 2008-09-09
- Inventor: Lingyi A. Zheng , Trung T. Doan , Lyle D. Breiner , Er-Xuan Ping , Kevin L. Beaman , Ronald A. Weimer , David J. Kubista , Cem Basceri
- Applicant: Lingyi A. Zheng , Trung T. Doan , Lyle D. Breiner , Er-Xuan Ping , Kevin L. Beaman , Ronald A. Weimer , David J. Kubista , Cem Basceri
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: C23C16/00
- IPC: C23C16/00 ; C23C16/455 ; H01L21/306

Abstract:
The present disclosure suggests several systems and methods for batch processing of microfeature workpieces, e.g., semiconductor wafers or the like. One exemplary implementation provides a method of depositing a reaction product on each of a batch of workpieces positioned in a process chamber in a spaced-apart relationship. A first gas may be delivered to an elongate first delivery conduit that includes a plurality of outlets spaced along a length of the conduit. A first gas flow may be directed by the outlets to flow into at least one of the process spaces between adjacent workpieces along a first vector that is transverse to the direction in which the workpieces are spaced. A second gas may be delivered to an elongate second delivery conduit that also has outlets spaced along its length. A second gas flow of the second gas may be directed by the outlets to flow into the process spaces along a second vector that is transverse to the first direction.
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