Invention Grant
- Patent Title: Control device and analyzer
- Patent Title (中): 控制装置和分析仪
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Application No.: US11105560Application Date: 2005-04-14
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Publication No.: US07403873B2Publication Date: 2008-07-22
- Inventor: Ken'ichi Okuno , Hiroyuki Morihara , Tadayuki Yamaguchi , Tomomi Sugiyama
- Applicant: Ken'ichi Okuno , Hiroyuki Morihara , Tadayuki Yamaguchi , Tomomi Sugiyama
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Global IP Counselors, LLP
- Priority: JP11-341085 19991130
- Main IPC: G06F17/40
- IPC: G06F17/40 ; G06F15/00

Abstract:
The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer (2) and a control device (1) are connected by a network (3). Error data and sample data taken from assay of a quality control substance are transmitted from the control device (1) to the analyzer (2). The analyzer (2) is made to be remotely operable from the control device (1) and when troubles arise repair from the control device (1) is possible. The control device (1) tallies sample data, and provides the tally results to a Web page. The analyzer (2) accesses the Web page using a WWW browser, and can perform external quality control in real time.
Public/Granted literature
- US20050177345A1 Control device and analyzer Public/Granted day:2005-08-11
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