Invention Grant
US07348784B2 Error factor acquisition device, method, program, and recording medium
失效
误差因子采集装置,方法,程序和记录介质
- Patent Title: Error factor acquisition device, method, program, and recording medium
- Patent Title (中): 误差因子采集装置,方法,程序和记录介质
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Application No.: US10572381Application Date: 2004-09-14
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Publication No.: US07348784B2Publication Date: 2008-03-25
- Inventor: Masato Haruta , Hiroyuki Sato , Takeshi Tanabe , Yoshikazu Nakayama
- Applicant: Masato Haruta , Hiroyuki Sato , Takeshi Tanabe , Yoshikazu Nakayama
- Applicant Address: JP Tokyo
- Assignee: ADVANTEST Corporation
- Current Assignee: ADVANTEST Corporation
- Current Assignee Address: JP Tokyo
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2003-325793 20030918
- International Application: PCT/JP2004/013713 WO 20040914
- International Announcement: WO2005/029102 WO 20050331
- Main IPC: G01R35/00
- IPC: G01R35/00

Abstract:
A measurement system for circuit parameters of a device under test (DUT) that reduces the number of attachments and detachments of calibration kits. An error factor acquisition device includes a first calibrator connected to ports of a network analyzer that has a first state realization unit that determines open-circuit, short-circuit, and standard load states for the ports. Second calibrators connected to the first calibrator and the DUT have a second state realization unit that determines open-circuit, short-circuit, and standard load states for the ports. The first calibrator includes first connection units that connect the ports to the first state realization unit or to the respective second calibrators, while the second calibrators respectively include a second connection unit that connects the ports to the second state realization unit or the DUT.
Public/Granted literature
- US20070029989A1 Error factor acquisition device, method, program, and recording medium Public/Granted day:2007-02-08
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