发明授权
US07333217B2 System and method for detecting and correcting position deviations of an object having a curved surface
有权
用于检测和校正具有曲面的物体的位置偏差的系统和方法
- 专利标题: System and method for detecting and correcting position deviations of an object having a curved surface
- 专利标题(中): 用于检测和校正具有曲面的物体的位置偏差的系统和方法
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申请号: US10538978申请日: 2002-12-20
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公开(公告)号: US07333217B2公开(公告)日: 2008-02-19
- 发明人: Ichitaroh Satoh
- 申请人: Ichitaroh Satoh
- 申请人地址: JP Tokyo
- 专利权人: Yamatake Corporation
- 当前专利权人: Yamatake Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Quarles & Brady LLP
- 代理商 Robert D. Atkins
- 国际申请: PCT/US02/40788 WO 20021220
- 国际公布: WO2004/059245 WO 20040715
- 主分类号: G01B11/14
- IPC分类号: G01B11/14
摘要:
A position deviation system and method detects and corrects position deviations between the optical axis of an optical system, such as an exposure apparatus, and the center of a curved shaped object, such as a spherical shaped semiconductor. The system determines position deviations by illuminating the curved surface, passing light that is reflected off of the illuminated curved surface through a first lens having an optical axis and a first body. An image having a substantially central portion is formed on a surface using the reflected light. The position deviation is determined based on a position of the substantially central portion of the formed image relative to the optical axis.
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