发明授权
- 专利标题: Semiconductor memory device
- 专利标题(中): 半导体存储器件
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申请号: US11444487申请日: 2006-06-01
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公开(公告)号: US07277341B2公开(公告)日: 2007-10-02
- 发明人: Katsuyuki Fujita , Kosuke Hatsuda , Takashi Ohsawa
- 申请人: Katsuyuki Fujita , Kosuke Hatsuda , Takashi Ohsawa
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
- 优先权: JP2005-162828 20050602
- 主分类号: G11C7/00
- IPC分类号: G11C7/00 ; G11C8/00
摘要:
A semiconductor memory device has first and second sense nodes which are provided corresponding to first and second bit lines, and a sense amplifier which is connected to the first and second sense nodes and senses data read out from a memory cell, wherein the sense amplifier includes an initial sense circuit which increases a potential difference between the first and second sense nodes in a first period after beginning sense operation, and a latch circuit which increases and holds the potential difference between the first and second sense nodes in a second period after the first period, wherein the initial sense circuit includes first and second transistors of first conductive type, third and fourth transistors of first conductive type, and fifth and sixth transistors of first conductive type, wherein the latch circuit includes seventh and eighth transistors of first conductive type, and ninth and tenth transistors of second conductive type.
公开/授权文献
- US20060274590A1 Semiconductor memory device 公开/授权日:2006-12-07
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