Invention Grant
US07257289B2 Spectral microscope and method for data acquisition using a spectral microscope
有权
光谱显微镜和使用光谱显微镜进行数据采集的方法
- Patent Title: Spectral microscope and method for data acquisition using a spectral microscope
- Patent Title (中): 光谱显微镜和使用光谱显微镜进行数据采集的方法
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Application No.: US10250152Application Date: 2003-06-07
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Publication No.: US07257289B2Publication Date: 2007-08-14
- Inventor: Frank Olschewski
- Applicant: Frank Olschewski
- Applicant Address: DE Wetzlar
- Assignee: Leica Microsystems CMS GmbH
- Current Assignee: Leica Microsystems CMS GmbH
- Current Assignee Address: DE Wetzlar
- Priority: DE10227111 20020617
- Main IPC: G02B6/26
- IPC: G02B6/26

Abstract:
A spectral scanning microscope and a method for data acquisition using a spectral scanning microscope are disclosed. A computer system is provided that encompasses a memory and a database. In combination with the computer system and/or the database, a continuous wavelength subregion that serves to illuminate the specimen can be selected from a continuous wavelength region using the spectral selection means. Also in combination with the computer system together with the spectral selection means, a detection band can be selected from the detected light beam.
Public/Granted literature
- US20030231825A1 SPECTRAL MICROSCOPE AND METHOD FOR DATA ACQUISITION USING A SPECTRAL MICROSCOPE Public/Granted day:2003-12-18
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