Invention Grant
US07257289B2 Spectral microscope and method for data acquisition using a spectral microscope 有权
光谱显微镜和使用光谱显微镜进行数据采集的方法

  • Patent Title: Spectral microscope and method for data acquisition using a spectral microscope
  • Patent Title (中): 光谱显微镜和使用光谱显微镜进行数据采集的方法
  • Application No.: US10250152
    Application Date: 2003-06-07
  • Publication No.: US07257289B2
    Publication Date: 2007-08-14
  • Inventor: Frank Olschewski
  • Applicant: Frank Olschewski
  • Applicant Address: DE Wetzlar
  • Assignee: Leica Microsystems CMS GmbH
  • Current Assignee: Leica Microsystems CMS GmbH
  • Current Assignee Address: DE Wetzlar
  • Priority: DE10227111 20020617
  • Main IPC: G02B6/26
  • IPC: G02B6/26
Spectral microscope and method for data acquisition using a spectral microscope
Abstract:
A spectral scanning microscope and a method for data acquisition using a spectral scanning microscope are disclosed. A computer system is provided that encompasses a memory and a database. In combination with the computer system and/or the database, a continuous wavelength subregion that serves to illuminate the specimen can be selected from a continuous wavelength region using the spectral selection means. Also in combination with the computer system together with the spectral selection means, a detection band can be selected from the detected light beam.
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