Invention Grant
- Patent Title: Methods and apparatus for thermal management of an integrated circuit die
- Patent Title (中): 集成电路管芯的热管理方法和装置
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Application No.: US10821822Application Date: 2004-04-09
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Publication No.: US07158911B2Publication Date: 2007-01-02
- Inventor: Stephen H. Gunther , Frank Binns , Jack D. Pippin , Linda J. Rankin , Edward A. Burton , Douglas M. Carmean , John M. Bauer
- Applicant: Stephen H. Gunther , Frank Binns , Jack D. Pippin , Linda J. Rankin , Edward A. Burton , Douglas M. Carmean , John M. Bauer
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agent Kerry D. Tweet
- Main IPC: H01L31/58
- IPC: H01L31/58

Abstract:
An integrated, on-chip thermal management system providing closed-loop temperature control of an IC device and methods of performing thermal management of an IC device. The thermal management system comprises a temperature detection element, a power modulation element, a control element, and a visibility element. The temperature detection element includes a temperature sensor for detecting die temperature. The power modulation element may reduce the power consumption of an IC device by directly lowering the power consumption of the IC device, by limiting the speed at which the IC device executes instructions, by limiting the number of instructions executed by the IC device, or by a combination of these techniques. The control element allows for control over the behavior of the thermal management system, and the visibility element allows external devices to monitor the status of the thermal management system.
Public/Granted literature
- US20040195674A1 Methods and apparatus for thermal management of an integrated circuit die Public/Granted day:2004-10-07
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