Invention Grant
- Patent Title: Mass spectrometer
- Patent Title (中): 质谱仪
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Application No.: US11126218Application Date: 2005-05-11
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Publication No.: US07129478B2Publication Date: 2006-10-31
- Inventor: Takashi Baba , Hiroyuki Satake , Yasuaki Takada
- Applicant: Takashi Baba , Hiroyuki Satake , Yasuaki Takada
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Reed Smith LLP
- Agent Stanley P. Fisher, Esq.; Juan Carlos A. Marquez, Esq.
- Priority: JP2004-152835 20040524
- Main IPC: B01D59/44
- IPC: B01D59/44 ; H01J49/00

Abstract:
A mass spectrometer having an ion source section capable of creating positive ions and negative ions at high efficiency. The ion source is comprised of an ion source section for creating ions of a sample gas, a mass spectrometric section for conducting mass separation of created ions, linear RF generating multipole electrodes, magnetic fields generation means, a sample gas introduction system, a reaction gas introduction system and an electron source in which the linear RF generating multipole electrodes generate linear RF multipole electric fields. A static magnetic fields is applied in parallel on the center axis where the linear RF multipole electric fields are zero. A sample gas and a reagent gas are introduced into the ion source section. Electrons are injected for creating reaction of the positive ions or negative ions.
Public/Granted literature
- US20050258354A1 Mass spectrometer Public/Granted day:2005-11-24
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