Invention Grant
- Patent Title: Apparatus and method of measuring write magnetic field of recording head
- Patent Title (中): 测量记录头写入磁场的装置和方法
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Application No.: US10989610Application Date: 2004-11-17
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Publication No.: US07079340B2Publication Date: 2006-07-18
- Inventor: Seigo Igaki , Takahisa Ueno , Tohru Horie , Iwao Okamoto
- Applicant: Seigo Igaki , Takahisa Ueno , Tohru Horie , Iwao Okamoto
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Armstrong, Kratz, Quintos, Hanson & Brooks, LLP
- Priority: JP2004-136459 20040430
- Main IPC: G11B5/09
- IPC: G11B5/09

Abstract:
After a measurement apparatus records a magnetization state of a reference pattern on at least one specific track of a recording medium, it generates a leakage magnetic field of a demagnetization pattern and demagnetizes the magnetization state of the reference pattern using the leakage magnetic field. Then, the measurement apparatus calculates a difference between the read output of a reference pattern before demagnetization and the read output of a reference pattern after demagnetization on the specific track and obtains a leakage magnetic field of a recording head from the obtained difference.
Public/Granted literature
- US20050243454A1 Apparatus and method of measuring write magnetic field of recording head Public/Granted day:2005-11-03
Information query
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