Invention Grant
- Patent Title: Microspectrometer system with selectable aperturing
- Patent Title (中): 显微分光光度计系统可选择开孔
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Application No.: US10786178Application Date: 2004-02-25
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Publication No.: US07078696B2Publication Date: 2006-07-18
- Inventor: Renée C. Nesnidal , George Skupniewicz , N. Simon Nunn
- Applicant: Renée C. Nesnidal , George Skupniewicz , N. Simon Nunn
- Applicant Address: US WI Madison
- Assignee: Thermo Electron Scientific Instruments Corporation
- Current Assignee: Thermo Electron Scientific Instruments Corporation
- Current Assignee Address: US WI Madison
- Agency: Foley & Lardner LLP
- Main IPC: G01J5/02
- IPC: G01J5/02 ; G01J3/00

Abstract:
Mirror elements are selectively interposable in the beam paths in a dual aperture microspectrometer system to selectively bypass the aperture element in transmission or reflection modes to increase optical throughput and field of view. The system may be operated in a dual aperture transmission mode or reflection mode and in modes in which the aperture is bypassed before or after the infrared beam reaches the sample. The system may be operated to bypass the aperture both before and after the sample, which may be utilized with an array detector having multiple detector elements in which an image of the sample is formed on the array detector.
Public/Granted literature
- US20050178968A1 Microspectrometer system with selectable aperturing Public/Granted day:2005-08-18
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