Invention Grant
- Patent Title: Mass spectrometer
- Patent Title (中): 质谱仪
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Application No.: US10401944Application Date: 2003-03-31
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Publication No.: US07064319B2Publication Date: 2006-06-20
- Inventor: Yuichiro Hashimoto , Izumi Waki , Kiyomi Yoshinari , Yasushi Terui , Tsukasa Shishika , Marvin L. Vestal
- Applicant: Yuichiro Hashimoto , Izumi Waki , Kiyomi Yoshinari , Yasushi Terui , Tsukasa Shishika , Marvin L. Vestal
- Applicant Address: JP Tokyo US CT Norwalk
- Assignee: Hitachi High-Technologies Corporation,Applera Corporation
- Current Assignee: Hitachi High-Technologies Corporation,Applera Corporation
- Current Assignee Address: JP Tokyo US CT Norwalk
- Agency: Antonelli, Terry, Stout and Kraus, LLP.
- Main IPC: H01J49/42
- IPC: H01J49/42

Abstract:
A mass spectrometer according to the present invention has an ionization source for generating ions; an ion trap for accumulating the ions; a time-of-flight mass spectrometer for performing mass spectrometry analysis on the ions by use of a flight time; a collision damping chamber disposed between the ion trap and the time-of-flight mass spectrometer and having a plurality of electrodes therein, which produce a multi-pole electric field, wherein a gas is introduced into the collision damping chamber to reduce kinetic energy of the ions ejected from the ion trap; and an ion transmission adjusting mechanism disposed between the ion trap and the collision damping chamber to allow or prevent injection of the ions from the ion trap to the collision damping chamber. The mass spectrometer provides greatly enhanced qualitative and quantitative analysis capabilities, as compared with conventional techniques.
Public/Granted literature
- US20040195502A1 Mass spectrometer Public/Granted day:2004-10-07
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