Invention Grant
- Patent Title: Instrument for measuring lifetime of fluorescene
- Patent Title (中): 用于测量荧光寿命的仪器
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Application No.: US10344850Application Date: 2000-08-18
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Publication No.: US07002162B1Publication Date: 2006-02-21
- Inventor: Masatoshi Fujimoto , Shinichiro Aoshima , Makoto Hosoda , Yutaka Tsuchiya
- Applicant: Masatoshi Fujimoto , Shinichiro Aoshima , Makoto Hosoda , Yutaka Tsuchiya
- Applicant Address: JP Shizuoka
- Assignee: Hamamatsu Photonics K.K.
- Current Assignee: Hamamatsu Photonics K.K.
- Current Assignee Address: JP Shizuoka
- Agency: Drinker Biddle & Reath LLP
- International Application: PCT/JP00/05549 WO 20000818
- International Announcement: WO02/16913 WO 20020228
- Main IPC: G01N21/64
- IPC: G01N21/64

Abstract:
A fluorescence component that passes through a region of a detection medium where a change in refractive index has been induced through a nonlinear optical effect produced in the detection medium by a gate pulse is observed as a fluorescence image by utilizing a change in polarization state. By observing the change in position of the fluorescence image while correlating with the change over time in the fluorescence, a fluorescence lifetime measuring apparatus is realized with which the change over time in the fluorescence, in particular the fluorescence lifetime, can be measured efficiently with high temporal resolution.
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