Invention Grant
- Patent Title: Information processing apparatus, defect analysis program, and defect analysis method
- Patent Title (中): 信息处理装置,缺陷分析程序和缺陷分析方法
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Application No.: US09752837Application Date: 2000-12-28
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Publication No.: US06901535B2Publication Date: 2005-05-31
- Inventor: Nobuyuki Yamauchi , Natsumi Matsumoto , Akira Sawaoka
- Applicant: Nobuyuki Yamauchi , Natsumi Matsumoto , Akira Sawaoka
- Applicant Address: JP Kanagawa-ken
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Kanagawa-ken
- Agency: Kilpatrick Stockton LLP
- Agent Brenda O. Holmes
- Priority: JPP11-375859 19991228; JPP2000-396112 20001226
- Main IPC: G06F11/28
- IPC: G06F11/28 ; G06F11/32 ; G06F11/36 ; G06F11/00

Abstract:
The present invention has an display section for displaying an operation state of a program to a user in a time series manner based on program execution history information, an input section for allowing the user to designate a portion of a defect in the displayed operation sate, and an operation analysis section for analyzing a cause of the defect from the portion of the defect pointed out from the user by the input section and from the operation state of the program, and for specifying a solution for solving the cause of the defect. The operation analysis section regenerates the operation state on which the specified solution is reflected, and the display section displays the cause of the defect, the solution and the regenerated operation state to the user.
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