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US06877113B2 Break determining circuit for a debugging support unit in a semiconductor integrated circuit 失效
用于半导体集成电路中的调试支持单元的断开确定电路

Break determining circuit for a debugging support unit in a semiconductor integrated circuit
摘要:
A semiconductor integrated circuit including a debugging support unit and a buffer memory for temporarily storing trace data, the debugging support unit comprising a break detection member that detects a break signal externally inputted and a break determining member that determines whether the break signal requests to shift to break processing after outputting all the trace data stored in the buffer memory or the break signal requests to shift to the break processing with immediately suspending trace data outputting.
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