Invention Grant
- Patent Title: Diagnostic method for manufacturing processes
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Application No.: US10236450Application Date: 2002-09-06
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Publication No.: US06859756B2Publication Date: 2005-02-22
- Inventor: John R. Allen
- Applicant: John R. Allen
- Applicant Address: US WA Anacortes
- Assignee: Red X Holdings LLC
- Current Assignee: Red X Holdings LLC
- Current Assignee Address: US WA Anacortes
- Agency: White & Case LLP
- Main IPC: G05B19/401
- IPC: G05B19/401 ; G05B23/02 ; G06F15/46

Abstract:
A method for use in a system for diagnosing the causes of manufacturing defects involves process characterization. A set of forms is identified for a workpiece and for a piece of manufacturing equipment that acts upon the workpiece. The forms for the workpiece are preferably a hierarchic set of geometric forms. Each such geometric form corresponds to an aspect of the action of the manufacturing equipment upon the workpiece. A plurality of measurements is made on a defective workpiece following the hierarchical order of forms. The measurements are compared to a reference datum, and a deviation from the datum is computed. If the deviation exceeds a preselected threshold, an alert condition results, attributable to the action of the manufacturing equipment. Targeted adjustment corresponding to the action that caused the defect can then be made to the equipment.
Public/Granted literature
- US20040049364A1 Diagnostic method for manufacturing processes Public/Granted day:2004-03-11
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