发明授权
US6054651A Foamed elastomers for wafer probing applications and interposer
connectors
失效
用于晶圆探测应用和插入式连接器的发泡弹性体
- 专利标题: Foamed elastomers for wafer probing applications and interposer connectors
- 专利标题(中): 用于晶圆探测应用和插入式连接器的发泡弹性体
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申请号: US752469申请日: 1996-11-19
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公开(公告)号: US6054651A公开(公告)日: 2000-04-25
- 发明人: Keith Edward Fogel , James Lupton Hedrick , Paul Alfred Lauro , Yun-Hsin Liao , Da-Yuan Shih
- 申请人: Keith Edward Fogel , James Lupton Hedrick , Paul Alfred Lauro , Yun-Hsin Liao , Da-Yuan Shih
- 申请人地址: NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: NY Armonk
- 主分类号: H01B3/46
- IPC分类号: H01B3/46 ; H01B7/00
摘要:
The present invention is directed to a new foamed elastomer composition including elastomer, hollow fillers, and reinforced fillers for supporting the conducting wires in the test probes for wafer level testing and burn in and interposer connector applications. The thermally stable elastomer resin is mixed with hollow fillers and reinforced fillers before filling into the probe or connector mold with an array of elongated conducting wires, then is crosslinked by a crosslinking agent and a catalyst. The use of compressible hollow fillers to foam the elastomer has been successful to enhance the compliance and resilience, and to reduce the thermal expansion, density, and dielectric constant of the elastomer.
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