A plurality of electrostatic discharge protection devices are disclosed for use with semiconductor chip packages of a type having a top surface, a bottom surface, and disposed between the top surface and the bottom surface a plurality of lateral surface with extending therefrom a plurality of connector pins disposed thereon. The electrostatic discharge protection devices disclosed herein are heat sensitive in that they automatically withdraw from electrical contact with the connecting pins upon introduction of sufficient heat such as that of soldering. In addition, disclosed herein is a electrostatic discharge protection device for manual withdrawal should the electrostatic discharge protection be required after the soldering process has been terminated.