Invention Grant
- Patent Title: Characteristic X-ray detecting device
- Patent Title (中): 特征X射线检测装置
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Application No.: US562325Application Date: 1990-08-03
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Publication No.: US5103470APublication Date: 1992-04-07
- Inventor: Kanemasa Iwamoto
- Applicant: Kanemasa Iwamoto
- Applicant Address: JPX Osaka
- Assignee: Rigaku Industrial Corp.
- Current Assignee: Rigaku Industrial Corp.
- Current Assignee Address: JPX Osaka
- Priority: JPX1-91014[U] 19890803
- Main IPC: G01N23/22
- IPC: G01N23/22 ; G01N23/223
Abstract:
An X-ray detecting device for detecting characteristic X-rays emitted from a substance to be detected, which device comprises a vessel having a window defined therein for the passage of the characteristic X-rays emitted from the substance, therethrough into the vessel, and an X-ray detector accommodated within the vessel for the detection of the characteristic X-rays entering the vessel through the window. A portion of the vessel positioned on one side closer to the window and away from a sensing surface of the X-ray detector, upon which the characteristic X-rays impinge, and a peripheral lip area of the vessel defining the window have at least a respective area which is exposed to the interior of the vessel. This respective area is formed with a material which does not contain said substance.
Public/Granted literature
- US5689642A Recipient prioritized communication channel profiles Public/Granted day:1997-11-18
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