Invention Grant
- Patent Title: Method and apparatus for investigating materials with X-rays
- Patent Title (中): 用X射线检测材料的方法和装置
-
Application No.: US541261Application Date: 1990-06-20
-
Publication No.: US5044001APublication Date: 1991-08-27
- Inventor: Chia-Gee Wang
- Applicant: Chia-Gee Wang
- Applicant Address: TX Houston
- Assignee: Nanod Ynamics, Inc.
- Current Assignee: Nanod Ynamics, Inc.
- Current Assignee Address: TX Houston
- Main IPC: G01N23/02
- IPC: G01N23/02 ; G01N23/223 ; G21K7/00 ; H01J35/00 ; H01J35/14 ; H01J37/256
Abstract:
A method of investigating materials, especially biological specimens, utilizes a focused accelerated beam of electrons within an evacuated chamber, striking a metal foil within the chamber and exposing a specimen outside the evacuated chamber to x-rays generated in the metal foil. The apparatus of the invention functions as an x-ray microscope and in a preferred embodiment, as a scanning x-ray microscope.
Public/Granted literature
- US5649614A Merchandise chute shield for coin actuated bulk vending machines Public/Granted day:1997-07-22
Information query