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US5044001A Method and apparatus for investigating materials with X-rays 失效
用X射线检测材料的方法和装置

Method and apparatus for investigating materials with X-rays
Abstract:
A method of investigating materials, especially biological specimens, utilizes a focused accelerated beam of electrons within an evacuated chamber, striking a metal foil within the chamber and exposing a specimen outside the evacuated chamber to x-rays generated in the metal foil. The apparatus of the invention functions as an x-ray microscope and in a preferred embodiment, as a scanning x-ray microscope.
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