Invention Grant
- Patent Title: Measurement apparatus employing radiation
- Patent Title (中): 使用辐射的测量装置
-
Application No.: US124558Application Date: 1987-11-24
-
Publication No.: US4885759APublication Date: 1989-12-05
- Inventor: Toshimasa Tomoda , Shinji Badono , Masaki Komaru
- Applicant: Toshimasa Tomoda , Shinji Badono , Masaki Komaru
- Applicant Address: JPX CAX
- Assignee: Mitsubishi Denki Kabushiki Kaisha,Petro-Canada, Inc.
- Current Assignee: Mitsubishi Denki Kabushiki Kaisha,Petro-Canada, Inc.
- Current Assignee Address: JPX CAX
- Priority: JPX61-280553 19861125
- Main IPC: G01N23/08
- IPC: G01N23/08 ; G01N23/12
Abstract:
A measuring apparatus for measuring a physical property of a substance using radiation has a source of radiation for irradiating the substance, a radiation detector which is disposed on the opposite side of the substance from the radiation source, a mask for allowing radiaton to enter the radiation detector only along n prescribed pathways, and a signal processing and calculating device for calculating the physical property of the substance based on the radiation which is incident upon the radiation detector. The mask has n different mask patterns each comprising a plurality of pattern elements which allow the passage of radiation and which can be positioned between the substance and the radiation detector in alignment with the radiation pathways.
Public/Granted literature
- US6046558A Electronic padlock Public/Granted day:2000-04-04
Information query