发明授权
- 专利标题: Probe tracing method and means for coordinate measuring machine
- 专利标题(中): 坐标测量机的探头跟踪方法和方法
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申请号: US269888申请日: 1981-06-03
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公开(公告)号: US4406068A公开(公告)日: 1983-09-27
- 发明人: Yutaka Tomita , Akiro Shibagaki
- 申请人: Yutaka Tomita , Akiro Shibagaki
- 申请人地址: JPX Tokyo
- 专利权人: Mitutoyo Mfg. Co., Ltd.
- 当前专利权人: Mitutoyo Mfg. Co., Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX55-86155 19800625; JPX55-86157 19800625
- 主分类号: G01B7/008
- IPC分类号: G01B7/008 ; G01B21/04 ; G05B19/18 ; G01B7/03
摘要:
A probe tracing method and apparatus for a coordinate measuring machine including a trace control device in which the probe returns back along almost the same route as the proceeding contact stroke right after the contact with the object to be measured.
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