Invention Application
- Patent Title: QUICK CHARGE LOSS MITIGATION USING TWO-PASS CONTROLLED DELAY
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Application No.: US18895273Application Date: 2024-09-24
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Publication No.: US20250013382A1Publication Date: 2025-01-09
- Inventor: Kishore Kumar Muchherla , Dung V. Nguyen , Dave Scott Ebsen , Tomoharu Tanaka , James Fitzpatrick , Huai-Yuan Tseng , Akira Goda , Eric N. Lee
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
Exemplary methods, apparatuses, and systems include a quick charge loss (QCL) mitigation manager for controlling writing data bits to a memory device. The QCL mitigation manager receives a first set of data bits for programming to memory. The QCL mitigation manager writes a first subset of data bits of the first set of data bits to a first memory block of the memory during a first pass of programming. The QCL mitigation manager writes a second subset of data bits of the first set of data bits to the first memory block during a second pass of programming in response to determining that the threshold delay is satisfied.
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