Invention Application
- Patent Title: METHOD OF FORMING INTERCONNECT STRUCTURE
-
Application No.: US18794736Application Date: 2024-08-05
-
Publication No.: US20240395613A1Publication Date: 2024-11-28
- Inventor: Keunwook SHIN , Sanghoon AHN , Woojin LEE , Kyung-Eun BYUN , Junghoo SHIN , Hyeonjin SHIN , Yunseong LEE
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2020-0110589 20200831
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L21/285

Abstract:
Provided is a method of forming an interconnect structure. The method includes preparing a substrate including a first metal layer and a first insulating layer, selectively forming a carbon layer having an sp2 bonding structure on the first metal layer, selectively forming a second insulating layer on the first insulating layer, forming a third insulating layer to cover the second insulating layer, and forming a second metal layer electrically connected to the first metal layer.
Information query
IPC分类: