Invention Application
- Patent Title: INSPECTION SYSTEM AND INSPECTION METHOD
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Application No.: US18574638Application Date: 2022-07-06
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Publication No.: US20240377553A1Publication Date: 2024-11-14
- Inventor: Zhiqiang CHEN , Li ZHANG , Qingping HUANG , Yong ZHOU , Hui DING , Xin JIN , Chao JI
- Applicant: Tsinghua University , Nuctech Company Limited
- Applicant Address: CN Beijing; CN Beijing
- Assignee: Tsinghua University,Nuctech Company Limited
- Current Assignee: Tsinghua University,Nuctech Company Limited
- Current Assignee Address: CN Beijing; CN Beijing
- Priority: CN202110768765.X 20210707
- International Application: PCT/CN2022/104131 WO 20220706
- Main IPC: G01V5/226
- IPC: G01V5/226

Abstract:
Provided are an inspection method, and an inspection system including: at least one ray source; a detector assembly and a conveying device. At least one ray source and the detector assembly may move in a traveling direction relative to the conveying device, so that the to-be-inspected object may enter an inspection region. When viewed along a central axis of the inspection region, at least one ray source may translate between scanning positions, and a translation distance of at least one ray source between two adjacent scanning positions is greater than a spacing between adjacent target spots of each ray source. When at least one ray source is located at one scanning position, at least one ray source and the detector assembly move in the traveling direction and at least one ray source emits X-rays. After moving a predetermined distance, at least one ray source translates to another scanning position.
Public/Granted literature
- US2162725A Upright printing press Public/Granted day:1939-06-20
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