- 专利标题： SYSTEMS AND METHODS FOR TRAINING AND VALIDATION OF MACHINE-LEARNING-BASED RF TRANSMIT/RECEIVE SYSTEMS
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申请号： US18643943申请日： 2024-04-23
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公开(公告)号： US20240364432A1公开(公告)日： 2024-10-31
- 发明人: Christopher N. White , Alexander Krauska , Alejandro C. Buritica
- 申请人： Tektronix, Inc.
- 申请人地址： US OR Beaverton
- 专利权人： Tektronix, Inc.
- 当前专利权人： Tektronix, Inc.
- 当前专利权人地址： US OR Beaverton
- 主分类号： H04B17/00
- IPC分类号： H04B17/00 ; H04B17/10 ; H04B17/15
摘要：
A test and measurement device includes a signal generator to generate a test signal, a signal analyzer to receive a response signal from an adaptive system under test (SUT), communications ports to allow reception of the response signal, and one or more processors to send a signal to the signal generator to generate a first test signal, receive a response signal from the signal analyzer, measure performance of the response signal, and report the performance to at least one of the SUT and a user workspace on the test and measurement device. A method of testing a system under test (SUT) includes generating and sending a test signal with a signal generator, receiving a response signal from the SUT at a signal analyzer, measuring performance of the response signal with respect to the test signal, and reporting the performance to at least one of the SUT and a user workspace.
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