Invention Publication
- Patent Title: IC NOISE IMMUNITY DETECTION DEVICE AND IC NOISE IMMUNITY DETECTION METHOD
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Application No.: US18290459Application Date: 2021-05-21
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Publication No.: US20240280631A1Publication Date: 2024-08-22
- Inventor: Yusuke YAMAKAJI , Masaomi WASHINO , Nobuyuki HARUNA
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- International Application: PCT/JP2021/019384 2021.05.21
- Date entered country: 2023-11-14
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R1/067

Abstract:
A signal generation unit outputs a first AC signal and a second AC signal having different phases as noise. A first coaxial cable transmits a first AC signal. A second coaxial cable transmits a second AC signal. A first probe is connected to the first coaxial cable and arranged in proximity to an IC on a printed circuit board to apply the first AC signal to the IC. A second probe is connected to the second coaxial cable and arranged in proximity to the IC to apply the second AC signal to the IC. A determination device determines whether the IC is malfunctioning, based on a state of the IC after application of the first AC signal and the second AC signal.
Information query