• 专利标题: DROPLET INSPECTION METHOD AND DEVICE USING 2-DIMENSIONAL IMAGE OF DROPLET
  • 申请号: US18402731
    申请日: 2024-01-03
  • 公开(公告)号: US20240278553A1
    公开(公告)日: 2024-08-22
  • 发明人: Sang Uk SON
  • 申请人: SEMES CO., LTD.
  • 申请人地址: KR Chungcheongnam-do
  • 专利权人: SEMES CO., LTD.
  • 当前专利权人: SEMES CO., LTD.
  • 当前专利权人地址: KR Chungcheongnam-do
  • 优先权: KR 20230022729 2023.02.21
  • 主分类号: B41J2/045
  • IPC分类号: B41J2/045 G01N15/0227
DROPLET INSPECTION METHOD AND DEVICE USING 2-DIMENSIONAL IMAGE OF DROPLET
摘要:
A droplet inspection method using a 2-dimensional (2D) image of a droplet includes ejecting ink onto a substrate based on a preset inspection pattern using an inkjet head, acquiring a 2D image of the droplet of ink ejected to a plurality of positions on the substrate using a measurement camera located on a side surface or above the substrate, and calculating a diameter of the droplet from the 2D image and calculating a volume of the droplet using the calculated diameter of the droplet and a pre-measured contact angle of the substrate for inspection.
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