发明公开
- 专利标题: MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT METHOD
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申请号: US18560882申请日: 2022-06-07
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公开(公告)号: US20240255594A1公开(公告)日: 2024-08-01
- 发明人: Yoshiharu YOSHII , Tsutomu OOTSUKA , Shingo HAMADA , Norikazu MIZUOCHI , Yuki TAKEMURA
- 申请人: SUMIDA CORPORATION , Kyoto University
- 申请人地址: JP Tokyo
- 专利权人: SUMIDA CORPORATION,Kyoto University
- 当前专利权人: SUMIDA CORPORATION,Kyoto University
- 当前专利权人地址: JP Tokyo
- 优先权: JP 21127304 2021.08.03
- 国际申请: PCT/JP2022/022913 2022.06.07
- 进入国家日期: 2023-11-14
- 主分类号: G01R33/26
- IPC分类号: G01R33/26 ; G01R33/36
摘要:
A high-frequency magnetic field generator 2 applies microwave to a magnetic resonance member 1. A magnet 3 applies a static magnetic field to the magnetic resonance member 1. An irradiating device 12 irradiates the magnetic resonance member 1 with incident light of a specific wavelength. An FT 4 senses a measurement target magnetic field using a primary coil 4a and applies an application magnetic field corresponding to the sensed measurement target magnetic field to the magnetic resonance member 1 using a secondary coil 4b. A pillar-shaped light guide member 41 guides the incident light to the magnetic resonance member 1, and a pillar-shaped light guide member 42 guides fluorescence that the magnetic resonance member 1 emits from the magnetic resonance member 1. Further, the magnetic resonance member 1 is arranged between an end surface of the light guide member 41 and an end surface of the light guide member 42 in a hollow part of the secondary coil 4b of the FT 4 and in a hollow part of the aforementioned magnet 3.
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