- 专利标题: PREPARATION METHOD FOR GROWING GERMANIUM SULFIDE (GeS2) SINGLE-CRYSTAL THIN FILM ON SiO2 SUBSTRATE
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申请号: US18276887申请日: 2021-12-30
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公开(公告)号: US20240120431A1公开(公告)日: 2024-04-11
- 发明人: Guoqiang LI , Sheng CHEN , Wenliang WANG , Jixing CHAI
- 申请人: SOUTH CHINA UNIVERSITY OF TECHNOLOGY
- 申请人地址: CN Guangzhou
- 专利权人: SOUTH CHINA UNIVERSITY OF TECHNOLOGY
- 当前专利权人: SOUTH CHINA UNIVERSITY OF TECHNOLOGY
- 当前专利权人地址: CN Guangzhou
- 优先权: CN 2111157718.8 2021.09.30
- 国际申请: PCT/CN2021/143380 2021.12.30
- 进入国家日期: 2023-08-11
- 主分类号: H01L31/18
- IPC分类号: H01L31/18 ; C30B25/04 ; C30B25/18 ; C30B29/46 ; H01L31/032
摘要:
Clean version of the Abstract A preparation method for growing a germanium sulfide (GeS2) single-crystal thin film on a SiO2 substrate includes: cleaning a surface of a substrate with acetone, ethanol and deionized water, where the substrate is a Si/SiO2 substrate or a SiO2 glass substrate; photoetching the substrate, spin-coating a photoresist, and performing photoetching and dry etching or wet etching to obtain a groove pattern; depositing a germanium (Ge)-crystal layer in the groove pattern of the substrate to obtain a treated substrate; and putting the treated substrate into a chemical vapor deposition (CVD) device for growth, a growth source being high-purity sulfur (S) powder and high-purity Ge powder, thereby obtaining a GeS2 single-crystal thin film on the SiO2 substrate. The preparation method can grow GeS2 single crystals on the SiO2 substrate. The GeS2 single crystals have a high crystalline quality and a small surface roughness.
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