- 专利标题: SEMICONDUCTOR DIE PACKAGE WITH CONDUCTIVE LINE CRACK PREVENTION DESIGN
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申请号: US18513866申请日: 2023-11-20
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公开(公告)号: US20240096778A1公开(公告)日: 2024-03-21
- 发明人: Ya-Huei LEE , Shu-Shen YEH , Kuo-Ching HSU , Shyue-Ter LEU , Po-Yao LIN , Shin-Puu JENG
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsinchu
- 主分类号: H01L23/498
- IPC分类号: H01L23/498
摘要:
A semiconductor die package is provided. The semiconductor die package includes a semiconductor die and a package substrate supporting and electrically connected to the semiconductor die. The semiconductor die has a corner. The package substrate includes several conductive lines, and one of the conductive lines under the corner of the semiconductor die includes a first line segment and a second line segment connected to the first line segment. The first line segment is linear and extends in a first direction. The second line segment is non-linear and has a varying extension direction.
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