Invention Publication
- Patent Title: Light Source and Automatic Analyzer
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Application No.: US18274581Application Date: 2021-11-25
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Publication No.: US20240085311A1Publication Date: 2024-03-14
- Inventor: Shohei ARITA , Yuya MATSUOKA , Takahiro ANDO , Yasuhiro KETA
- Applicant: Hitachi High-Tech Corporation
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: Hitachi High-Tech Corporation
- Current Assignee: Hitachi High-Tech Corporation
- Current Assignee Address: JP Minato-ku, Tokyo
- Priority: JP 21036070 2021.03.08
- International Application: PCT/JP2021/043173 2021.11.25
- Date entered country: 2023-07-27
- Main IPC: G01N21/01
- IPC: G01N21/01 ; G01N21/31 ; G01N35/02

Abstract:
There is provided an automatic analyzer that keeps a temperature of alight emitting element of alight source constant and has high accuracy analysis performance. A light source for an automatic analyzer includes: a substrate including a light source; a temperature adjustment unit configured to adjust a temperature of the light source; a first optical element configured to emit light from the light source to an outside; and a member configured to cover the light source, in which the temperature adjustment unit, the substrate, the member, and the first optical element are arranged in this order, the optical element is assembled so as to be accommodated in the member, and the temperature adjustment unit puts the light source, the member, and the optical element under the same temperature control.
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