发明公开
- 专利标题： SCALABLE ANONYMIZED DEFECT SCANNING OF COMPONENTS IN DEPLOYED COMPUTING SYSTEMS
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申请号： US17852662申请日： 2022-06-29
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公开(公告)号： US20240004770A1公开(公告)日： 2024-01-04
- 发明人: Rajesh Poornachandran , Kaushik Balasubramanian , Karan Puttannaiah
- 申请人： Intel Corporation
- 申请人地址： US CA Santa Clara
- 专利权人： Intel Corporation
- 当前专利权人： Intel Corporation
- 当前专利权人地址： US CA Santa Clara
- 主分类号： G06F11/27
- IPC分类号： G06F11/27 ; G06F11/07
摘要：
Managing scan detection of a component in a computing system includes detecting a scan interrupt, reading a scan register of the component, the scan register including a hashed identifier (ID) of the component; getting material vintage information of the component based at least in part on the hashed ID; and initiating a scan of the component based at least in part on the material vintage information to detect any defects in the component.
公开/授权文献
- US3262251A Gas diffusion cell elements 公开/授权日：1966-07-26
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