- 专利标题: Methods of Evaluating Radar Devices and Radar Devices
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申请号: US17903789申请日: 2022-09-06
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公开(公告)号: US20230075303A1公开(公告)日: 2023-03-09
- 发明人: Raghavendran Vagarappan Ulaganathan , Ashutosh Baheti , Reinhard-Wolfgang Jungmaier , Saverio Trotta
- 申请人: Infineon Technologies AG
- 申请人地址: DE Neubiberg
- 专利权人: Infineon Technologies AG
- 当前专利权人: Infineon Technologies AG
- 当前专利权人地址: DE Neubiberg
- 优先权: EP21195596 20210908
- 主分类号: G01S7/40
- IPC分类号: G01S7/40
摘要:
A method for testing a radar device including a master radar device and a slave radar device includes: moving a test target through a field of view of the radar device; measuring an angle of the test target with respect to the radar device at a plurality of positions; evaluating the reliability of the measured angles; and specifying at least one of a usable field of view of the radar device or a number of required repetitions for a reliable measurement based on the evaluating.
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