- 专利标题: MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
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申请号: US18363725申请日: 2023-08-01
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公开(公告)号: US20230377946A1公开(公告)日: 2023-11-23
- 发明人: Chi-Ming Chen , Kuei-Ming Chen , Po-Chun Liu , Chung-Yi Yu , Chia-Shiung Tsai
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsinchu
- 分案原申请号: US17461991 2021.08.30
- 主分类号: H01L21/762
- IPC分类号: H01L21/762 ; H01L21/768
摘要:
A manufacturing method of a semiconductor device includes at least the following steps. A sacrificial substrate is provided. An epitaxial layer is formed on the sacrificial substrate. An etch stop layer is formed on the epitaxial layer. Carbon atoms are implanted into the etch stop layer. A capping layer and a device layer are formed on the etch stop layer. A handle substrate is bonded to the device layer. The sacrificial substrate, the epitaxial layer, and the etch stop layer having the carbon atoms are removed from the handle substrate.
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