- 专利标题: METHOD FOR PRODUCING A SEMICONDUCTOR ARRANGEMENT
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申请号: US18142109申请日: 2023-05-02
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公开(公告)号: US20230275059A1公开(公告)日: 2023-08-31
- 发明人: Olaf Hohlfeld
- 申请人: Infineon Technologies AG
- 申请人地址: DE Neubiberg
- 专利权人: Infineon Technologies AG
- 当前专利权人: Infineon Technologies AG
- 当前专利权人地址: DE Neubiberg
- 优先权: EP 157627.1 2019.02.18
- 分案原申请号: US16792682 2020.02.17
- 主分类号: H01L23/00
- IPC分类号: H01L23/00 ; H01L27/12
摘要:
A method for producing a semiconductor arrangement includes: forming a first metallization layer on a first side of a dielectric insulation layer, the first metallization layer having at least two sections, each section being separated from a neighboring section by a recess; arranging a semiconductor body on one of the sections of the first metallization layer; and forming at least one indentation between a first side of the semiconductor body and a closest edge of the respective section of the first metallization layer. A distance between the first side and the closest edge of the section of the first metallization layer is between 0.5 mm and 5 mm.
公开/授权文献
- US11955450B2 Method for producing a semiconductor arrangement 公开/授权日:2024-04-09
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