Invention Publication
- Patent Title: CHECKING METHOD AND CHECKING SYSTEM BASED ON MILLIMETER WAVE SECURITY INSPECTION DEVICE AND SERVER
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Application No.: US18013094Application Date: 2021-06-24
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Publication No.: US20230251399A1Publication Date: 2023-08-10
- Inventor: Zhiqiang CHEN , Ziran ZHAO , Yingkang JIN , Xiaoyi HE , Li ZHANG , Mengjiao ZHAO , Zhimin ZHENG , Yihai ZHANG , Yaning LI , Xiaoxiao FENG
- Applicant: NUCTECH COMPANY LIMITED , Tsinghua University
- Applicant Address: CN Haidian District, Beijing
- Assignee: NUCTECH COMPANY LIMITED,Tsinghua University
- Current Assignee: NUCTECH COMPANY LIMITED,Tsinghua University
- Current Assignee Address: CN Haidian District, Beijing
- Priority: CN 2010600568.2 2020.06.28
- International Application: PCT/CN2021/102077 2021.06.24
- Date entered country: 2022-12-27
- Main IPC: G01V8/00
- IPC: G01V8/00

Abstract:
Provided is a server of a checking system based on a millimeter wave security inspection device, connected to a security inspection instrument through a switching system, the server includes a memory and a processor, the memory stores instructions, and the instructions, when executed by the processor, cause the processor to: receive a scanned image of an object and an ATR image interpretation result of the object from the security inspection instrument, wherein the ATR image interpretation result is obtained by the security inspection instrument performing an automatic threat recognition (ATR) image interpretation on the scanned image, and perform a manual inspection task on the object and perform an image interpretation task on the scanned image according to a working mode, wherein the working mode indicates whether the checking system is provided with a manual inspection station and an image interpretation station.
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