• 专利标题: PHOTOIONIZATION DETECTOR AND METHOD FOR GAS SAMPLE ANALYSIS
  • 申请号: US17920487
    申请日: 2021-04-22
  • 公开(公告)号: US20230145929A1
    公开(公告)日: 2023-05-11
  • 发明人: Yves GAMACHE
  • 申请人: Mécanique Analytique Inc.
  • 申请人地址: CA Thetford Mines, Québec
  • 专利权人: Mécanique Analytique Inc.
  • 当前专利权人: Mécanique Analytique Inc.
  • 当前专利权人地址: CA Thetford Mines, Québec
  • 国际申请: PCT/CA2021/050553 2021.04.22
  • 进入国家日期: 2022-10-21
  • 主分类号: G01N27/64
  • IPC分类号: G01N27/64
PHOTOIONIZATION DETECTOR AND METHOD FOR GAS SAMPLE ANALYSIS
摘要:
A photoionization detector (PID) is disclosed that includes an ionization chamber configured to allow a flow of a gas sample therethrough, the ionization chamber defining an ionization region and a detection region, a photoionization source configured to generate ionizing radiation for irradiating the flow of the gas sample in the ionization region, an electric-field ionization source configured to apply an ionizing electric field inside the ionization chamber to intersect the flow of the gas sample in the ionization region, the ionizing radiation and the ionizing electric field being configured to ionize the gas sample, and an ion detector configured to detect, in the detection region, an ionization current resulting from the ionized gas sample. The PID may also include an optical window, for example, made of a window material including sapphire, configured to allow at least part of the ionizing radiation to pass therethrough prior to entering the ionization region.
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