Invention Application
- Patent Title: DECOUPLING CAPACITORS AND METHODS OF FABRICATION
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Application No.: US17358930Application Date: 2021-06-25
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Publication No.: US20220415896A1Publication Date: 2022-12-29
- Inventor: Juan G. Alzate-Vinasco , Travis W. LaJoie , Wilfred Gomes , Fatih Hamzaoglu , Pulkit Jain , James Waldemer , Mark Armstrong , Bernhard Sell , Pei-Hua Wang , Chieh-Jen Ku
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Main IPC: H01L27/108
- IPC: H01L27/108 ; H01L29/786 ; H01L29/66

Abstract:
A device structure includes transistors on a first level in a first region and a first plurality of capacitors on a second level, above the first level, where a first electrode of the individual ones of the first plurality of capacitors are coupled with a respective transistor. The device structure further includes a second plurality of capacitors on the second level in a second region adjacent the first region, where individual ones of the second plurality of capacitors include a second electrode, a third electrode and an insulator layer therebetween, where the second electrode of the individual ones of the plurality of capacitors are coupled with a first interconnect on a third level above the second level, and where the third electrode of the individual ones of the plurality of capacitors are coupled with a second interconnect.
Information query
IPC分类: