- 专利标题: DEPTH MEASUREMENT THROUGH DISPLAY
-
申请号: US17756552申请日: 2020-11-26
-
公开(公告)号: US20220398759A1公开(公告)日: 2022-12-15
- 发明人: Patrick Schindler , Benjamin Rein , Christian Bonsignore , Michael Eberspach , Peter Schillen
- 申请人: TRINAMIX GMBH
- 申请人地址: DE Ludwigshafen am Rhein
- 专利权人: TRINAMIX GMBH
- 当前专利权人: TRINAMIX GMBH
- 当前专利权人地址: DE Ludwigshafen am Rhein
- 优先权: EP19211927.9 20191127
- 国际申请: PCT/EP2020/083468 WO 20201126
- 主分类号: G06T7/521
- IPC分类号: G06T7/521 ; G01B11/22 ; G01B11/25 ; G06V10/60
摘要:
Disclosed herein is a display device including an illumination source for projecting an illumination pattern including a plurality of illumination features on a scene; an optical sensor for determining a first image including a plurality of reflection features; a translucent display, where the illumination source and the optical sensor are placed in a direction of propagation of the illumination pattern in front of the display; and an evaluation device configured for evaluating the first image by identifying and sorting the reflection features with respect to brightness, each reflection feature including a beam profile, determining a longitudinal coordinate for each reflection feature by analyzing their beam profiles, unambiguously matching reflection features with corresponding illumination features using the longitudinal coordinate classifying a reflection feature as a real feature or a false feature, rejecting the false features, and generating a depth map for the real features using the longitudinal coordinate.
公开/授权文献
- US11989896B2 Depth measurement through display 公开/授权日:2024-05-21
信息查询