Invention Application
- Patent Title: MANAGEMENT OF MULTIPLE MEASUREMENT GAP
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Application No.: US17741208Application Date: 2022-05-10
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Publication No.: US20220369143A1Publication Date: 2022-11-17
- Inventor: Yoonoh YANG , Sangwook LEE , Suhwan LIM , Jaehyuk JANG , Jinyup HWANG , Jinwoong PARK
- Applicant: LG ELECTRONICS INC.
- Applicant Address: KR Seoul
- Assignee: LG ELECTRONICS INC.
- Current Assignee: LG ELECTRONICS INC.
- Current Assignee Address: KR Seoul
- Priority: KR10-2021-0060413 20210511,KR10-2021-0142053 20211022
- Main IPC: H04W24/10
- IPC: H04W24/10 ; H04W24/08

Abstract:
A disclosure of this specification provides a method for performing measurement, by performed a UE (User Equipment), comprising: receiving priority information from a base station, wherein the priority information includes each priority of MGs (Measurement Gaps); performing measurement with one among the MGs, based on the priority information, wherein the one among the MGs is overlapped with the other MGs in time domain, wherein the one among the MGs has higher priority than the other MGs.
Information query