- 专利标题: ANALYSIS METHOD AND DEVICES FOR SAME
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申请号: US17608472申请日: 2020-04-29
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公开(公告)号: US20220237064A1公开(公告)日: 2022-07-28
- 发明人: Simon Alt , Tobias Schlotterer , Daniel Voigt , Markus Hummel , Jens Berner , Hauke Bensch , Philipp Oetinger , Stefano Bell , Martin Weickgenannt
- 申请人: Dürr Systems AG
- 申请人地址: DE Bietigheim-Bissingen
- 专利权人: Dürr Systems AG
- 当前专利权人: Dürr Systems AG
- 当前专利权人地址: DE Bietigheim-Bissingen
- 优先权: DE102019112099.3 20190509,DE102019206839.1 20190510
- 国际申请: PCT/DE2020/100360 WO 20200429
- 主分类号: G06F11/07
- IPC分类号: G06F11/07 ; G06F11/00
摘要:
In order to provide a method for fault analysis in an industrial-method plant, for example a painting plant, by means of which fault situations are analysable simply and reliably, it is proposed according to the invention that the method should comprise the following: in particular automatic recognition of a fault situation in the industrial-method plant (101); storage of a fault situation data set for the respective recognised fault situation, in a fault database (136); automatic determination of a cause of the fault for the fault situation and/or automatic determination of process values that are relevant to the fault situation, on the basis of the fault data set of a respective recognised fault situation.
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